HUBER+SUHNER is set to unveil its solutions for bench-top and system testing at this year’s DesignCon exhibition in Santa Clara.
At the exhibition, the company will focus on its range of electrical solutions and assemblies developed and enhanced for high speed digital testing. Designed to be highly flexible, with outstanding electrical characteristics and best in-class phase stability, HUBER+SUHNER solutions provide revolutionary high speed testing.
“In a world where performance, speed and density matter, innovative high speed digital testing solutions are key,” said Stéphanie Jarno, market manager instrumentation at HUBER+SUHNER. “Our developments come at a time when companies are looking for high performing yet cost efficient solutions for their testing requirements, and HUBER+SUHNER’s new products address exactly these concerns.”
Displayed at the booth is MXPM, a product extension of the multicoax MXP product line. The small form factor and outstanding electrical characteristics combined with reliable mating and ease of use make the MXP series an excellent solution for bench-top and system testing. MXPM, the new precision multicoax connector solution, has a coaxial-to-PCB transition of up to 85 GHz, smart interface protection and a new locking mechanism.
“The MXPM series is a revolutionary multicoax solution in response to the most stringent testing requirements. Electrically transparent and offering a very small pitch, this solution is well suited for applications tolerating no signal integrity degradation. Our initial product line operates up to 65GHz with a 85GHz version coming soon,” said Stéphanie.
Also at the HUBER+SUHNER booth will be the SUCOFLEX 500 series for VNA, where the new assembly – SUCOFLEX 526S – will be making its debut. HUBER+SUHNER will also be introducing the Microbend L, the low loss assembly with increased phase stability and power handling capability for use in low profile and dense applications.
