Optical metrology leader Zygo Corporation (a business unit of Ametek, Inc.) has announced a new webinar focused on measuring and quantifying surface defects. The webinar will be held on Wednesday 24th March 2021 at 09.00 EST, 14.00 GMT, 15.00 CET, and interested parties can register free here.
Traditional optical metrology instruments have evolved into measuring more than surface parameters like roughness, flatness, step height, and other topography parameters. Many instruments now offer capabilities for quantitative defect detection and analysis for enhanced quality control.
The webinar will provide an overview of defect analysis using ZYGO’s Mx™ metrology software and explore a wide variety of methods for identifying and quantifying defects on different surfaces. This will allow companies to determine the best defect analysis technique for their samples and to learn how to employ the appropriate analysis tools in their process.
The webinar will focus on available software tools that can be leveraged to support and deploy a defect analysis solution, understand the right data processing techniques to identify and analyze defects effectively, and configure an application to automate the process of defect detection analysis.
It will be presented by Kyle Delldonna, an engineer in the Advanced Applications Group at Zygo Corporation, who has expertise in applying 3D optical metrology tools and techniques for non-contact metrology and characterization of surfaces across a wide range of industry applications.
ZYGO has a 50-year heritage in the precision metrology sector. From its inception, the company has sought to address the industry’s most challenging issues, led by motivated employees driving new innovative solutions from concept to product introduction. Over 750 issued patents have been issued to ZYGO scientists and engineers who are actively engaged in professional societies, standards committees, university collaborations, and professional publication activities.
Having served the demand for precise metrology solutions across the industry with quality, market-leading optical metrology tools since the 1970s, ZYGO is well-positioned to curate highly informative webinars and run a series focussed on all aspects of cutting-edge optical metrology solutions.
Registration is limited, so it is recommended that interested parties reserve their spots for this webinar today!
